Details
Title
Sohi, Pirouz
Sciper ID
259406
Affiliated labs
POWERLAB
Publications
Critical thickness of GaN on AlN: impact of growth temperature and dislocation density
Gas pressure measurement device
High conductivity InAlN/GaN multi-channel two-dimensional electron gases
Low-temperature growth of n(++)-GaN by metalorganic chemical vapor deposition to achieve low-resistivity tunnel junctions on blue light emitting [...]
P-GaN Tri-Gate MOS Structure for Normally-Off GaN Power Transistors
p-NiO Junction Termination Extensions for High Voltage Vertical GaN Devices
Gas pressure measurement device
High conductivity InAlN/GaN multi-channel two-dimensional electron gases
Low-temperature growth of n(++)-GaN by metalorganic chemical vapor deposition to achieve low-resistivity tunnel junctions on blue light emitting [...]
P-GaN Tri-Gate MOS Structure for Normally-Off GaN Power Transistors
p-NiO Junction Termination Extensions for High Voltage Vertical GaN Devices
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Sohi, P.
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