Details
Title
Parsapour, Fazel
Sciper ID
199504
Affiliated labs
LC
Publications
Abnormal Grain Growth in AlScN Thin Films Induced by Complexion Formation at Crystallite Interfaces
Determination of elastic and piezoelectric properties of Al0.84Sc0.16N thin films
Free standing and solidly mounted Lamb wave resonators based on Al0.85Sc0.15N thin film
Growth, Integration, and Functional Characterization of AlScN Thin Films for RF MEMS Devices
Growth, Properties, and Applications of Al1-xScxN Thin Films
Impact of negative bias on the piezoelectric properties through the incidence of abnormal oriented grains in Al0.62Sc0.38N thin films
Material Constants Extraction For Alscn Thin Films Using A Dual Mode Baw Resonator
Material Parameter Extraction for Complex AlScN Thin Film Using Dual Mode Resonators in Combination with Advanced Microstructural Analysis and Fi[...]
Determination of elastic and piezoelectric properties of Al0.84Sc0.16N thin films
Free standing and solidly mounted Lamb wave resonators based on Al0.85Sc0.15N thin film
Growth, Integration, and Functional Characterization of AlScN Thin Films for RF MEMS Devices
Growth, Properties, and Applications of Al1-xScxN Thin Films
Impact of negative bias on the piezoelectric properties through the incidence of abnormal oriented grains in Al0.62Sc0.38N thin films
Material Constants Extraction For Alscn Thin Films Using A Dual Mode Baw Resonator
Material Parameter Extraction for Complex AlScN Thin Film Using Dual Mode Resonators in Combination with Advanced Microstructural Analysis and Fi[...]
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Parsapourkolour, Mohammadfazel
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