Details
Title
Dukic Pjanic, Maja
Sciper ID
212854
Publications
Advances in self-sensing techniques for atomic force microscopy
Analysis of local deformation effects in resistive strain sensing of a submicron-thickness AFM cantilever
Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe microscopy
Direct-write nanoscale printing of nanogranular tunnelling strain sensors for sub-micrometre cantilevers
Focused electron beam induced deposition: A perspective
High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers
Probing the Morphology and Evolving Dynamics of 3D Printed Nanostructures Using High-Speed Atomic Force Microscopy
Single-Cycle-PLL Detection for Real-Time FM-AFM Applications
Analysis of local deformation effects in resistive strain sensing of a submicron-thickness AFM cantilever
Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe microscopy
Direct-write nanoscale printing of nanogranular tunnelling strain sensors for sub-micrometre cantilevers
Focused electron beam induced deposition: A perspective
High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers
Probing the Morphology and Evolving Dynamics of 3D Printed Nanostructures Using High-Speed Atomic Force Microscopy
Single-Cycle-PLL Detection for Real-Time FM-AFM Applications
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Dukic, Maja
Đukić Pjanić, Maja
Dukic, M.
Đukić Pjanić, Maja
Dukic, M.
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