Notice détaillée
Titre
Garetto, Davide
Sciper ID
181878
Laboratoires affiliés
LSM
Publications
Advanced physics for simulation of ultrascaled devices with UTOXPP solver
Analysis of defect capture cross sections using non-radiative multiphonon-assisted trapping model
Characterization & Modeling of Gate-Induced-Drain-Leakage with complete overlap and fringing model
Characterization and physical modeling of endurance in embedded non-volatile memory technology
Comparing defect characterization techniques with non-radiative multiphonon charge trapping model AC analysis, trap-assisted-tunneling and charge[...]
Modeling Stressed MOS Oxides Using a Multiphonon-Assisted Quantum Approach—Part I: Impedance Analysis
Modeling Stressed MOS Oxides Using a Multiphonon-Assisted Quantum Approach—Part II: Transient Effects
Modeling study of capacitance and gate current in strained HighK-Metal gate technology
Numerical and Compact Modeling of Embedded Flash Memory Devices Targeted for IC Design
Small signal analysis of electrically-stressed oxides with Poisson-Schroedinger based multiphonon capture model
Voir toutes les publications (16)
Analysis of defect capture cross sections using non-radiative multiphonon-assisted trapping model
Characterization & Modeling of Gate-Induced-Drain-Leakage with complete overlap and fringing model
Characterization and physical modeling of endurance in embedded non-volatile memory technology
Comparing defect characterization techniques with non-radiative multiphonon charge trapping model AC analysis, trap-assisted-tunneling and charge[...]
Modeling Stressed MOS Oxides Using a Multiphonon-Assisted Quantum Approach—Part I: Impedance Analysis
Modeling Stressed MOS Oxides Using a Multiphonon-Assisted Quantum Approach—Part II: Transient Effects
Modeling study of capacitance and gate current in strained HighK-Metal gate technology
Numerical and Compact Modeling of Embedded Flash Memory Devices Targeted for IC Design
Small signal analysis of electrically-stressed oxides with Poisson-Schroedinger based multiphonon capture model
Voir toutes les publications (16)
Employé pour
Garetto, D
Garetto, D.
Garetto, D.
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