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conference paper
Components for high-speed atomic force microscopy optimized for low phase-lag
2017
2017 IEEE International Conference on Advanced Intelligent Mechatronics (AIM)
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Name
AIM17_0234_FI.pdf
Access type
restricted
Size
3.09 MB
Format
Adobe PDF
Checksum (MD5)
03411eb8542ca90c515b570921e74bbc