Variability of Low Frequency Noise and mismatch in CORNER DOPED and standard CMOS technology
2017
Details
Title
Variability of Low Frequency Noise and mismatch in CORNER DOPED and standard CMOS technology
Author(s)
Coustans, Mathieu ; Jazaeri, Farzan ; Enz, Christian ; Krummenacher, Francois ; Kayal, Maher ; Meyer, Rene ; Acovic, Alexandre ; Habas, Predrag ; Lolivier, Jerome ; Bucher, Matthias
Published in
2017 International Conference on Noise and Fluctuations (ICNF)
Pages
1-4
Conference
2017 International Conference on Noise and Fluctuations (ICNF), Vilnius, Lithuania, 20-23 June 2017
Date
2017
Publisher
IEEE
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > ELAB - Electronics Laboratory
Scientific production and competences > EPFL Partners > Neuchâtel Campus > ICLAB - Integrated Circuits Laboratory
Scientific production and competences > STI - School of Engineering > STI Archives > ICLAB - Integrated Circuits Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Scientific production and competences > EPFL Partners > Neuchâtel Campus > ICLAB - Integrated Circuits Laboratory
Scientific production and competences > STI - School of Engineering > STI Archives > ICLAB - Integrated Circuits Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2017-08-02