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patent
Method and apparatus of using a scanning probe microscope
Fantner, Georg Ernest
•
Adams, Jonathan David
•
Nievergelt, Adrian Pascal
2016
a scanning probe microscope for high-speed imaging and/or nanomechanical mapping. The microscope comprises a scanning probe comprising a cantilever with a tip at the distal end; and means for modulating a tip-sample distance separating the tip from an intended sample to be viewed with the microscope, the means for modulating being adapted to provide a direct cantilever actuation.
Type
patent
EPO Family ID
56132979
Inventors
Fantner, Georg Ernest
•
Adams, Jonathan David
•
Nievergelt, Adrian Pascal
Note
Alternative title(s) : (de) Verfahren und vorrichtung zur verwendung eines rastersondenmikroskops (fr) Procédé et appareil d'utilisation d'un microscope-sonde à balayage
TTO classification
TTO:6.1486
EPFL units
Patent number | Country code | Kind code | Date issued |
US11112426 | US | B2 | 2021-09-07 |
US2018106830 | US | A1 | 2018-04-19 |
EP3295186 | EP | A1 | 2018-03-21 |
WO2016181325 | WO | A1 | 2016-11-17 |
Available on Infoscience
May 11, 2017
Use this identifier to reference this record