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  4. Coherence management in lithography printing systems
 
conference paper

Coherence management in lithography printing systems

Bernasconi, Johana  
•
Scharf, Toralf  
•
Herzig, Hans Peter  
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Erdmann, A
•
Kye, J
2016
Optical Microlithography Xxix
Conference on Optical Microlithography XXIX

In proximity lithography, interference and diffraction effects arise when printing small features because of the proximity gap. Different techniques are used in order to control and take advantage of theses effects. In this paper, the focus is set on the MO Exposure Optics developed to shape the angular spectrum of the exposure light. The MO Exposure Optics contains several elements including microlens arrays that have certain symmetry and sampling. The MO Exposure Optics allows to set the angle of illumination and can be used to define spatial coherence. We study here in detail the influence of different illumination settings on optical proximity correction (OPC) structures. We apply this concept for the first time to a LED illumination. The propagation of light after an optical proximity correction structure is measured by recording aerial images over a distance of up to 60 pm behind the mask with a high resolution microscope setup.(1) As an example structure, we investigate here an optical proximity correction structure that is intended to make the edge of a line sharper. Using illumination filter plates that limit the angle of illumination and increase the coherence lead to pronounced interference effects in aerial images as expected. But special settings of the illumination allow to achieve comparable results with much larger illumination angles and higher throughput. We will show examples and analyze the results.

  • Details
  • Metrics
Type
conference paper
DOI
10.1117/12.2219115
Web of Science ID

WOS:000391682900035

Author(s)
Bernasconi, Johana  
Scharf, Toralf  
Herzig, Hans Peter  
Voelkel, Reinhard
Bramati, Arianna
Editors
Erdmann, A
•
Kye, J
Date Issued

2016

Publisher

Spie-Int Soc Optical Engineering

Publisher place

Bellingham

Published in
Optical Microlithography Xxix
ISBN of the book

978-1-5106-0015-7

Total of pages

8

Series title/Series vol.

Proceedings of SPIE

Volume

9780

Start page

978016

Subjects

Proximity lithography

•

illumination systems

•

spatial coherence

•

illumination filter plates

•

MO Exposure Optics (R)

•

Optical Proximity Correction

•

Kohler integrator

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
OPT  
Event nameEvent placeEvent date
Conference on Optical Microlithography XXIX

San Jose, CA

FEB 23-25, 2016

Available on Infoscience
February 17, 2017
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/134428
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