000224661 001__ 224661
000224661 005__ 20190317000625.0
000224661 0247_ $$2doi$$a10.1088/1361-6463/aa5b11
000224661 02470 $$2ISI$$a000395880000001
000224661 037__ $$aARTICLE
000224661 245__ $$aDegradation in photoelectrochemical devices: Review with an illustrative case study
000224661 269__ $$a2017
000224661 260__ $$bIop Publishing Ltd$$c2017$$aBristol
000224661 300__ $$a23
000224661 336__ $$aReviews
000224661 520__ $$aThe durability, reliability, and robustness of photoelectrochemical (PEC) devices are key factors for advancing the practical large-scale implementation of cost-competitive solar fuel production. We review the known degradation mechanisms occurring in water-splitting photoelectrochemical devices. The degradation of single components is discussed in detail, and the parameters and conditions which influence it are presented. Device short-term durability depends on the semiconductor material and its interface with the electrolyte. Catalyst and electrolyte degradations are considerable challenges for long-term durability. We highlight how PEC device design choices can affect the salience of alternative degradation mechanisms. The PEC device architecture and the initial operating design point are crucial for observed device performance loss. Device degradation behavior is further impacted by irradiation intensity and concentration, and by current density and concentration. Enhancing a physical understanding of degradation phenomena and investigating their effect on component properties is of utmost importance for predicting performance loss and tackling the durability challenge of PEC devices.
000224661 6531_ $$aphotoelectrochemistry
000224661 6531_ $$adegradation
000224661 6531_ $$adevice modeling
000224661 700__ $$0249918$$g267460$$aNandjou Dongmeza, Fredy Intelligent
000224661 700__ $$0247143$$g207354$$aHaussener, Sophia
000224661 773__ $$j50$$tJournal of Physics D: Applied Physics$$k12$$q124002
000224661 8564_ $$uhttps://infoscience.epfl.ch/record/224661/files/Nandjou_et_al-2017-JPDAP.pdf$$zn/a$$s4333067$$yn/a
000224661 909C0 $$xU12656$$0252472$$pLRESE
000224661 909CO $$qGLOBAL_SET$$pSTI$$ooai:infoscience.tind.io:224661$$preview
000224661 917Z8 $$x207354
000224661 917Z8 $$x207354
000224661 917Z8 $$x207354
000224661 917Z8 $$x148230
000224661 937__ $$aEPFL-REVIEW-224661
000224661 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000224661 980__ $$aREVIEW