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research article

Noise Considerations in Low Vacuum Scanning Electron Microscopy

Tileli, Vasiliki  
•
Toth, M.
•
Knowles, R.
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2007
Microscopy and Microanalysis
  • Details
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Type
research article
DOI
10.1017/S1431927607077197
Author(s)
Tileli, Vasiliki  
Toth, M.
Knowles, R.
Thiel, B. L.
Date Issued

2007

Published in
Microscopy and Microanalysis
Volume

13

Issue

S02

Start page

1484

End page

1485

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
INE  
Available on Infoscience
April 22, 2016
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/125841
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