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research article
Critical impact of Ehrlich-Schwobel barrier on GaN surface morphology during homoepitaxial growth
We discuss the impact of kinetics, and in particular the effect of the Ehrlich-Schwobel barrier (ESB), on the growth and surface morphology of homoepitaxial GaN layers. The presence of an ESB can lead to various self-assembled surface features, which strongly affect the surface roughness. We present an indepth study of this phenomenon on GaN homoepitaxial layers grown by metal organic vapor phase epitaxy and molecular beam epitaxy. We show how a proper tuning of the growth parameters allows for the control of the surface morphology, independent of the growth technique. (C) 2015 Published by Elsevier By.
Type
research article
Web of Science ID
WOS:000364819900007
Authors
Publication date
2016
Publisher
Published in
Volume
433
Start page
36
End page
42
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
February 16, 2016
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