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research article
Micromechanical cantilever magnetometer with an integrated two-dimensional electron system
We have realized a micromechanical cantilever magnetometer with an integrated two-dimensional electron system (2DES) in an AlGaAs/GaAs heterostructuregrown by molecular-beam epitaxy(MBE). The cantilever was defined by lithography and wet-etched selectively to a MBE-grown stop layer. We reach a sensitivity of 10 −13 J/T, which enables us to study the de Haas–van Alphen effect in a 2DES of only 0.04 cm 2 area. We demonstrate that, at low temperature, the oscillation amplitude at even filling factors is enhanced by a factor of up to 1.8 with respect to the single-particle value.
Type
research article
Authors
Schwarz, M. P.
•
Grundler, D.
•
Meinel, I.
•
Heyn, Ch.
•
Heitmann, D.
Publication date
2000
Publisher
Published in
Volume
76
Issue
24
Article Number
3564
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
July 8, 2015
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