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research article
Ultrastructurally smooth thick partitioning and volume stitching for large-scale connectomics
2015
Focused-ion-beam scanning electron microscopy (FIB-SEM) has become an essential tool for studying neural tissue at resolutions below 10 nm x 10 nm x 10 nm, producing data sets optimized for automatic connectome tracing. We present a technical advance, ultrathick sectioning, which reliably subdivides embedded tissue samples into chunks (20 mu m thick) optimally sized and mounted for efficient, parallel FIB-SEM imaging. These chunks are imaged separately and then 'volume stitched' back together, producing a final three-dimensional data set suitable for connectome tracing.
Type
research article
Web of Science ID
WOS:000352083100016
Authors
Hayworth, Kenneth J.
•
Xu, C. Shan
•
Lu, Zhiyuan
•
•
Fetter, Richard D.
•
Tapia, Juan Carlos
•
Lichtman, Jeff W.
•
Hess, Harald F.
Publication date
2015
Publisher
Published in
Volume
12
Issue
4
Start page
319
End page
U55
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
May 29, 2015
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