Effect of Cavity Lifetime Variation on the Static and Dynamic Properties of 1.3-μm Wafer-Fused VCSELs

We investigate experimentally the impact of photon cavity lifetime variations on the static and dynamic performance of high-speed 1.3-mu m wavelength wafer-fused vertical-cavity surface-emitting lasers (VCSELs). The photon lifetime is modified by decreasing the top mirror reflectivity either by shallow-surface etching or by Bragg-reflector layer-pair removal. Significant improvements in both static and dynamic VCSEL performance as well as the extraction of internal VCSEL device parameters are achieved.


Published in:
IEEE Journal of Selected Topics in Quantum Electronics, 21, 6, 1-9
Year:
2015
Publisher:
Piscataway, Ieee-Inst Electrical Electronics Engineers Inc
ISSN:
1558-4542
Keywords:
Laboratories:




 Record created 2015-05-12, last modified 2018-09-13


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