Optimization Strategy of Numerical Simulations Applied to EPFL Substrate Model

A new methodology for modeling minority carriers diffusion in Smart Power ICs substrate using standard circuit simulators has been proposed by EPFL. For this purpose, a parasitic substrate network consisting of lumped elements is extracted from the circuit layout following a given substrate meshing strategy. In this work Design of Experiments (DOE) techniques are used to run a limited number of simulations to evaluate the influence of the meshing on the accuracy of the EPFL Substrate Model when compared to finite element simulations. A two-dimensional case study on a parasitic lateral bipolar is then proposed with both spice-like and finite element simulation results for the minority carriers diffusion. A linear model is developed to estimate the most important geometrical domains influencing the accuracy of the studied model.


Editor(s):
Napieralski, A
Published in:
2014 Proceedings Of The 21St International Conference On Mixed Design Of Integrated Circuits & Systems (Mixdes), 334-337
Presented at:
21st International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES), Lublin, POLAND, JUN 19-21, 2014
Year:
2014
Publisher:
New York, Ieee
ISBN:
978-83-63578-04-6
Keywords:
Laboratories:




 Record created 2015-02-20, last modified 2018-09-13


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