High-frequency multimodal atomic force microscopy

Multifrequency atomic force microscopy imaging has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample. Combining this development with recent gains in imaging speed through small cantilevers holds the promise of a convenient, high-speed method for obtaining nanoscale topography as well as mechanical properties. Nevertheless, instrument bandwidth limitations on cantilever excitation and readout have restricted the ability of multifrequency techniques to fully benefit from small cantilevers. We present an approach for cantilever excitation and deflection readout with a bandwidth of 20 MHz, enabling multifrequency techniques extended beyond 2 MHz for obtaining materials contrast in liquid and air, as well as soft imaging of delicate biological samples.


Published in:
Beilstein Journal of Nanotechnology, 5, 2459-2467
Year:
2014
Publisher:
Frankfurt Am Main, Beilstein-Institut
ISSN:
2190-4286
Keywords:
Laboratories:




 Record created 2014-12-31, last modified 2018-09-13

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