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  4. Measurement of In-Grain Orientation Gradients by EBSD and Comparison with Finite Element Results
 
research article

Measurement of In-Grain Orientation Gradients by EBSD and Comparison with Finite Element Results

Delannay, L.
•
Logé, R.E.  
•
Chastel, Y.
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2003
Advanced Engineering Materials

The characterization of In-grain orientation gradients by electron backscattering diffraction (EBSD) technique was studied. The study, based on finite element (FE) technique, involved the simulation of plane strain compression of the crystal grains. In regard to it, the construction of orientation distribution function (ODF) by superimposing spherical Gaussian distributions on the mean orientation of grains was also discussed.

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Type
research article
DOI
10.1002/adem.200300376
Author(s)
Delannay, L.
Logé, R.E.  
Chastel, Y.
Signorelli, J.W.
Van Houtte, P.
Date Issued

2003

Published in
Advanced Engineering Materials
Volume

5

Start page

597

End page

600

Subjects

Backscattering

•

Computer simulation

•

Crystal microstructure

•

Crystal orientation

•

electron diffraction

•

Finite element method

•

Grain boundaries

•

Grain size and shape

•

Orientation distribution functions (ODF)

•

Plasticity

•

Polycrystalline materials

•

Strain

•

Stress analysis

•

Textures

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
LMTM  
Available on Infoscience
November 14, 2014
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/108801
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