Measurement of In-Grain Orientation Gradients by EBSD and Comparison with Finite Element Results

The characterization of In-grain orientation gradients by electron backscattering diffraction (EBSD) technique was studied. The study, based on finite element (FE) technique, involved the simulation of plane strain compression of the crystal grains. In regard to it, the construction of orientation distribution function (ODF) by superimposing spherical Gaussian distributions on the mean orientation of grains was also discussed.


Published in:
Advanced Engineering Materials, 5, 597-600
Year:
2003
ISSN:
14381656
Keywords:
Laboratories:




 Record created 2014-11-14, last modified 2018-04-20


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