Measurement of In-Grain Orientation Gradients by EBSD and Comparison with Finite Element Results

• Published in: Advanced Engineering Materials (ISSN: 14381656 (ISSN)), vol. 5, p. 597-600
• Publication date: 2003

The characterization of In-grain orientation gradients by electron backscattering diffraction (EBSD) technique was studied. The study, based on finite element (FE) technique, involved the simulation of plane strain compression of the crystal grains. In regard to it, the construction of orientation distribution function (ODF) by superimposing spherical Gaussian distributions on the mean orientation of grains was also discussed.

Keywords: Backscattering ; Computer simulation ; Crystal microstructure ; Crystal orientation ; electron diffraction ; Finite element method ; Grain boundaries ; Grain size and shape ; Orientation distribution functions (ODF) ; Plasticity ; Polycrystalline materials ; Strain ; Stress analysis ; Textures

Reference

• EPFL-ARTICLE-203317
• doi:10.1002/adem.200300376

Record created on 2014-11-14, modified on 2017-05-10