research article
Measurement of In-Grain Orientation Gradients by EBSD and Comparison with Finite Element Results
The characterization of In-grain orientation gradients by electron backscattering diffraction (EBSD) technique was studied. The study, based on finite element (FE) technique, involved the simulation of plane strain compression of the crystal grains. In regard to it, the construction of orientation distribution function (ODF) by superimposing spherical Gaussian distributions on the mean orientation of grains was also discussed.
Type
research article
Author(s)
Date Issued
2003
Published in
Volume
5
Start page
597
End page
600
Editorial or Peer reviewed
REVIEWED
Written at
OTHER
EPFL units
Available on Infoscience
November 14, 2014
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