Numerical Analysis of Mode Discrimination by Intracavity Patterning in Long-Wavelength Wafer-Fused Vertical-Cavity Surface-Emitting Lasers

• Published in: Ieee Journal Of Quantum Electronics (ISSN: 0018-9197), vol. 50, num. 9, p. 732-740
• Piscataway: Institute of Electrical and Electronics Engineers, 2014

This paper presents an extensive numerical analysis of 1.3-mu m wavelength wafer-fused vertical-cavity surface-emitting lasers (VCSELs) incorporating intracavity patterning. Using a 3-D, self-consistent model of the physical phenomena in VCSELs, supported by experimental results used for parameter calibration, we investigate the influence of arch- and ring-shaped intracavity features with a broad range of geometrical parameters on the modal behavior of the VCSEL. To design and optimize the devices, we used intracavity patterning that provides very strong discrimination of higher order modes, pushing them out from the active region. This mechanism makes possible single mode operation under a broad range of currents and could potentially enhance the single-mode output power of these devices.

Keywords: Semiconductor lasers ; vertical cavity surface emitting lasers ; nanostructures ; numerical simulations

Reference

• EPFL-ARTICLE-202389
• doi:10.1109/Jqe.2014.2331764
• View record in Web of Science

Record created on 2014-10-23, modified on 2017-05-12