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  4. Numerical Analysis of Mode Discrimination by Intracavity Patterning in Long-Wavelength Wafer-Fused Vertical-Cavity Surface-Emitting Lasers
 
research article

Numerical Analysis of Mode Discrimination by Intracavity Patterning in Long-Wavelength Wafer-Fused Vertical-Cavity Surface-Emitting Lasers

Czyszanowski, Tomasz
•
Volet, Nicolas  
•
Walczak, Jaroslaw
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2014
Ieee Journal Of Quantum Electronics

This paper presents an extensive numerical analysis of 1.3-mu m wavelength wafer-fused vertical-cavity surface-emitting lasers (VCSELs) incorporating intracavity patterning. Using a 3-D, self-consistent model of the physical phenomena in VCSELs, supported by experimental results used for parameter calibration, we investigate the influence of arch- and ring-shaped intracavity features with a broad range of geometrical parameters on the modal behavior of the VCSEL. To design and optimize the devices, we used intracavity patterning that provides very strong discrimination of higher order modes, pushing them out from the active region. This mechanism makes possible single mode operation under a broad range of currents and could potentially enhance the single-mode output power of these devices.

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Type
research article
DOI
10.1109/Jqe.2014.2331764
Web of Science ID

WOS:000340209800001

Author(s)
Czyszanowski, Tomasz
Volet, Nicolas  
Walczak, Jaroslaw
Dems, Maciej
Sarzala, Robert P.
Iakovlev, Vladimir  
Sirbu, Alexei  
Mereuta, Alexandru  
Caliman, Andrei  
Kapon, Eli  
Date Issued

2014

Publisher

Institute of Electrical and Electronics Engineers

Published in
Ieee Journal Of Quantum Electronics
Volume

50

Issue

9

Start page

732

End page

740

Subjects

Semiconductor lasers

•

vertical cavity surface emitting lasers

•

nanostructures

•

numerical simulations

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPN  
Available on Infoscience
October 23, 2014
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/107743
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