DC and AC scanning thermal microscopy using micro-thermoelectric probe

A scanning thermal microscope working in passive mode is described. This tool uses a thermocouple probe and is presented as a thermal imaging system. The surface temperature distribution of a thermal micro-component is presented. We point out the capacity of our system to perform surface temperature images under conditions for which most of usual techniques cannot operate. The thermal microscope is insensitive to optical surface parameters, can operate from ambient to 1000K and allow measuring DC and AC temperature components.


Published in:
High Temperatures-High Pressures, 43, 4, 321-332
Year:
2014
Publisher:
Philadelphia, Old City Publishing
ISSN:
0018-1544
Keywords:
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 Record created 2014-08-29, last modified 2018-09-13

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