Mobility Measurement in Nanowires Based on Magnetic Field-Induced Current Splitting Method in H-Shape Devices

This work investigates a new method to measure mobility in nanowires. Based on a simple analytical approach and numerical simulations, we bring evidence that the traditional technique of Hall voltage measurement in low dimensional structures such as nanowires may generate large errors, while being challenging from a technological aspect. Here, we propose to extract the drift mobility in nanowires by measuring a variation of the electric current due to the presence of a magnetic field, in a specific nanowire network topology. This method overcomes the limitations inherent to the standard Hall effect technique and might open the way to a more precise and simple measurement of mobility in nanowires, still a matter of intensive research.


Published in:
IEEE Transactions on Electron Devices
Year:
2014
Publisher:
Piscataway, Institute of Electrical and Electronics Engineers
ISSN:
0018-9383
Keywords:
Laboratories:


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 Record created 2014-01-21, last modified 2018-01-28

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