Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. Bi-Modal Authentication in Mobile Environments Using Session Variability Modelling
 
conference paper

Bi-Modal Authentication in Mobile Environments Using Session Variability Modelling

Motlicek, Petr
•
El Shafey, Laurent  
•
Wallace, Roy
Show more
2012
Proceedings of the 21st International Conference on Pattern Recognition

We present a state-of-the-art bi-modal authentication system for mobile environments, using session variability modelling. We examine inter-session variability modelling (ISV) and joint factor analysis (JFA) for both face and speaker authentication and evaluate our system on the largest bi-modal mobile authentication database available, the MOBIO database, with over 61 hours of audio-visual data captured by 150 people in uncontrolled environments on a mobile phone. Our system achieves 2.6% and 9.7% half total error rate for male and female trials respectively – relative improvements of 78% and 27% compared to previous results.

  • Details
  • Metrics
Type
conference paper
Author(s)
Motlicek, Petr
El Shafey, Laurent  
Wallace, Roy
McCool, Chris
Marcel, Sébastien  
Date Issued

2012

Published in
Proceedings of the 21st International Conference on Pattern Recognition
Subjects

face verification

•

Speaker identification

Written at

EPFL

EPFL units
LIDIAP  
Available on Infoscience
December 19, 2013
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/98342
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés