Double Edge Triggered Feedback Flip-Flop based on Independent Gate FinFETs in 32nm Technology
2009
Details
Title
Double Edge Triggered Feedback Flip-Flop based on Independent Gate FinFETs in 32nm Technology
Author(s)
Jazaeri, F. ; AfzaliKusha, A.
Conference
the 4th IEEE SPIE European International Symposium on Microtechnologies, Germany, May 2009
Date
2009
Laboratories
STI
Record Appears in
Scientific production and competences > Unattributed publications > STI - STI - Unattributed publications
Scientific production and competences > STI - School of Engineering > STI - Unattributed publications
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Scientific production and competences > STI - School of Engineering > STI - Unattributed publications
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Record creation date
2013-10-19