Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Journal articles
  4. Low-temperature thin-film indium bonding for reliable wafer-level hermetic MEMS packaging
 
research article

Low-temperature thin-film indium bonding for reliable wafer-level hermetic MEMS packaging

Straessle, R.
•
Petremand, Y.  
•
Briand, D.  
Show more
2013
Journal Of Micromechanics And Microengineering

This paper reports on low-temperature and hermetic thin-film indium bonding for wafer-level encapsulation and packaging of delicate and temperature sensitive devices. This indium-bonding technology enables bonding of surface materials commonly used in MEMS technology. The temperature is kept below 140 degrees C for all process steps and no surface treatment is applied before and during bonding. This bonding technology allows hermetic sealing at 140 degrees C with a leak rate below 4 x 10(-12) mbar l s(-1) at room temperature. The tensile strength of the bonds up to 25 MPa goes along with a very high yield.

  • Details
  • Metrics
Type
research article
DOI
10.1088/0960-1317/23/7/075007
Web of Science ID

WOS:000321063300016

Author(s)
Straessle, R.
Petremand, Y.  
Briand, D.  
Dadras, M.
de Rooij, N. F.  
Date Issued

2013

Publisher

Institute of Physics

Published in
Journal Of Micromechanics And Microengineering
Volume

23

Issue

7

Article Number

075007

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
SAMLAB  
Available on Infoscience
October 1, 2013
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/95796
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés