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conference paper
Design of T-GEM detectors for X-ray diagnostics on JET
2013
Nuclear Instruments & Methods In Physics Research Section A-Accelerators Spectrometers Detectors And Associated Equipment
Upgraded high-resolution X-ray diagnostics on JET is expected to monitor the plasma radiation emitted by W46+ and Ni26+ ions at 2.4 keV and 7.8 keV photon energies, respectively. Both X-ray lines will be monitored by new generation energy-resolved micropattern gas detectors with 1-D position reconstruction capability. The detection structure is based on triple GEM (T-GEM) amplification structure followed by the strip readout electrode. This article presents a design of new detectors and prototype detector tests. (C) 2012 Elsevier B.V. All rights reserved.
Type
conference paper
Web of Science ID
WOS:000320597900010
Authors
Rzadkiewicz, J.
•
Dominik, W.
•
Scholz, M.
•
Chernyshova, M.
•
Czarski, T.
•
Czyrkowski, H.
•
Dabrowski, R.
•
Jakubowska, K.
•
Karpinski, L.
•
Kasprowicz, G.
Publication date
2013
Publisher
Published in
Nuclear Instruments & Methods In Physics Research Section A-Accelerators Spectrometers Detectors And Associated Equipment
Publisher place
Amsterdam
Total of pages
3
Volume
720
Start page
36
End page
38
Peer reviewed
REVIEWED
Available on Infoscience
October 1, 2013
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