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conference paper

Design of T-GEM detectors for X-ray diagnostics on JET

Rzadkiewicz, J.
•
Dominik, W.
•
Scholz, M.
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2013
Nuclear Instruments & Methods In Physics Research Section A-Accelerators Spectrometers Detectors And Associated Equipment
2nd International Conference on Frontiers in Diagnostic Technologies (FDT)

Upgraded high-resolution X-ray diagnostics on JET is expected to monitor the plasma radiation emitted by W46+ and Ni26+ ions at 2.4 keV and 7.8 keV photon energies, respectively. Both X-ray lines will be monitored by new generation energy-resolved micropattern gas detectors with 1-D position reconstruction capability. The detection structure is based on triple GEM (T-GEM) amplification structure followed by the strip readout electrode. This article presents a design of new detectors and prototype detector tests. (C) 2012 Elsevier B.V. All rights reserved.

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Type
conference paper
DOI
10.1016/j.nima.2012.12.041
Web of Science ID

WOS:000320597900010

Author(s)
Rzadkiewicz, J.
Dominik, W.
Scholz, M.
Chernyshova, M.
Czarski, T.
Czyrkowski, H.
Dabrowski, R.
Jakubowska, K.
Karpinski, L.
Kasprowicz, G.
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Date Issued

2013

Publisher

Elsevier Science Bv

Publisher place

Amsterdam

Published in
Nuclear Instruments & Methods In Physics Research Section A-Accelerators Spectrometers Detectors And Associated Equipment
Total of pages

3

Volume

720

Start page

36

End page

38

Subjects

Plasma diagnostic techniques and instrumentation

•

X-ray measurements

•

MPGD

•

GEM

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CRPP  
SPC  
Event name
2nd International Conference on Frontiers in Diagnostic Technologies (FDT)
Available on Infoscience
October 1, 2013
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/95612
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