conference paper
Design of T-GEM detectors for X-ray diagnostics on JET
2013
Nuclear Instruments & Methods In Physics Research Section A-Accelerators Spectrometers Detectors And Associated Equipment
Upgraded high-resolution X-ray diagnostics on JET is expected to monitor the plasma radiation emitted by W46+ and Ni26+ ions at 2.4 keV and 7.8 keV photon energies, respectively. Both X-ray lines will be monitored by new generation energy-resolved micropattern gas detectors with 1-D position reconstruction capability. The detection structure is based on triple GEM (T-GEM) amplification structure followed by the strip readout electrode. This article presents a design of new detectors and prototype detector tests. (C) 2012 Elsevier B.V. All rights reserved.
Type
conference paper
Web of Science ID
WOS:000320597900010
Author(s)
Rzadkiewicz, J.
Dominik, W.
Scholz, M.
Chernyshova, M.
Czarski, T.
Czyrkowski, H.
Dabrowski, R.
Jakubowska, K.
Karpinski, L.
Kasprowicz, G.
Date Issued
2013
Publisher
Publisher place
Amsterdam
Published in
Nuclear Instruments & Methods In Physics Research Section A-Accelerators Spectrometers Detectors And Associated Equipment
Total of pages
3
Volume
720
Start page
36
End page
38
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
Available on Infoscience
October 1, 2013
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