Design of T-GEM detectors for X-ray diagnostics on JET

• Presented at: 2nd International Conference on Frontiers in Diagnostic Technologies (FDT)
• Published in: Nuclear Instruments & Methods In Physics Research Section A-Accelerators Spectrometers Detectors And Associated Equipment (ISSN: 0168-9002), vol. 720, p. 36-38
• Amsterdam: Elsevier Science Bv, 2013

Upgraded high-resolution X-ray diagnostics on JET is expected to monitor the plasma radiation emitted by W46+ and Ni26+ ions at 2.4 keV and 7.8 keV photon energies, respectively. Both X-ray lines will be monitored by new generation energy-resolved micropattern gas detectors with 1-D position reconstruction capability. The detection structure is based on triple GEM (T-GEM) amplification structure followed by the strip readout electrode. This article presents a design of new detectors and prototype detector tests. (C) 2012 Elsevier B.V. All rights reserved.

Keywords: Plasma diagnostic techniques and instrumentation ; X-ray measurements ; MPGD ; GEM

Reference

• EPFL-CONF-189332
• doi:10.1016/j.nima.2012.12.041
• View record in Web of Science

Record created on 2013-10-01, modified on 2017-05-12