Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Journal articles
  4. Peculiarities in the pressure dependence of photoluminescence in InAlN
 
research article

Peculiarities in the pressure dependence of photoluminescence in InAlN

Kaminska, Agata
•
Nowakowski, Piotr
•
Staszczak, Grzegorz
Show more
2013
Physica Status Solidi B-Basic Solid State Physics

Studies of ambient-pressure and high-pressure behavior of photoluminescence (PL) for series of InxAl1-xN layers are presented. The measured evolution of PL energy (E-PL) with x is characterized by a clear decrease of E-PL and exhibits a strong bowing. This dependence corresponds to the predictions of ab initio calculations of the band-gap energy changes E-G with x. However, values of E-PL are clearly lower than E-G, for 0

  • Details
  • Metrics
Type
research article
DOI
10.1002/pssb.201200652
Web of Science ID

WOS:000318791900003

Author(s)
Kaminska, Agata
Nowakowski, Piotr
Staszczak, Grzegorz
Suski, Tadeusz
Suchocki, Andrzej
Carlin, Jean-Francois  
Grandjean, Nicolas  
Martin, Robert
Yamamoto, Akio
Date Issued

2013

Publisher

Wiley-V C H Verlag Gmbh

Published in
Physica Status Solidi B-Basic Solid State Physics
Volume

250

Issue

4

Start page

677

End page

682

Subjects

high-pressure spectroscopy

•

photoluminescence

•

pressure coefficient

•

ternary nitride alloys

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
LASPE  
Available on Infoscience
October 1, 2013
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/95105
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés