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research article
Reliability of 1310 nm Wafer Fused VCSELs
Wafer fusion vertical cavity surface emitting laser (VCSEL) technology has produced devices that successfully passed all mechanical and electrical Telcordia qualification tests. Accelerated lifetime tests result in times to 1% failure at 70 degrees C of 18 years and 30 years at VCSEL driving currents of 9 and 8 mA, respectively. These lifetimes meet the telecom industry reliability requirements for applications in fiber-optic communications networks.
Type
research article
Web of Science ID
WOS:000322341400004
Authors
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Publication date
2013
Published in
Volume
25
Issue
16
Start page
1555
End page
1558
Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
August 23, 2013
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