000187001 001__ 187001
000187001 005__ 20190509132440.0
000187001 0247_ $$2doi$$a10.5075/epfl-thesis-5741
000187001 02470 $$2urn$$aurn:nbn:ch:bel-epfl-thesis5741-3
000187001 02471 $$2nebis$$a9790308
000187001 037__ $$aTHESIS
000187001 041__ $$aeng
000187001 088__ $$a5741
000187001 245__ $$aHall Cells Offset Analysis and Modeling Approaches
000187001 269__ $$a2013
000187001 260__ $$bEPFL$$c2013$$aLausanne
000187001 336__ $$aTheses
000187001 502__ $$aC. Dehollain (présidente), H. Blanchard, S. Carrara, D. De Venuto
000187001 6531_ $$aHall cells
000187001 6531_ $$aoffset
000187001 6531_ $$aoffset temperature drift
000187001 6531_ $$acurrent-related sensitivity
000187001 6531_ $$athree-dimensional physical simulations
000187001 6531_ $$alumped circuit model
000187001 6531_ $$atemperature effects
000187001 700__ $$0244586$$g184703$$aPaun, Maria-Alexandra
000187001 720_2 $$aKayal, Maher$$edir.$$g105540$$0240539
000187001 720_2 $$aSallese, Jean-Michel$$edir.$$g106334$$0241224
000187001 8564_ $$uhttps://infoscience.epfl.ch/record/187001/files/EPFL_TH5741.pdf$$zn/a$$s19920580$$yn/a
000187001 909C0 $$xU11978$$0252315$$pELAB
000187001 909CO $$pthesis$$pthesis-bn2018$$pDOI$$ooai:infoscience.tind.io:187001$$qDOI2$$qGLOBAL_SET$$pSTI
000187001 917Z8 $$x108898
000187001 917Z8 $$x108898
000187001 917Z8 $$x108898
000187001 918__ $$dEDMI$$cIEL$$aSTI
000187001 919__ $$aGR-KA
000187001 920__ $$b2013$$a2013-6-17
000187001 970__ $$a5741/THESES
000187001 973__ $$sPUBLISHED$$aEPFL
000187001 980__ $$aTHESIS