A Hall sensor microsystem with integrated voltage and current references for continuous sensitivity calibration

This paper presents a Hall sensor microsystem output and sensitivity calibration targeting low drift (<50ppm/degrees C). The main system novelty is in a circuit-level solution using dedicated on-chip voltage and current references for a continuous measurement and calibration of the sensitivity. The system is fabricated in a 0.35 mu m CMOS technology, occupying an area of 11.55mm(2). The measurements of the calibrated system show 80ppm/degrees C on average and 30ppm/degrees C best-case sensitivity drift over a temperature range from -40 degrees C to 85 degrees C. Compared to the state of the art, the fully integrated system for sensitivity calibration adds no more than 18ppm/degrees C on average and 30ppm/degrees C in the worst case for the additional integration of one voltage and one current reference.


Published in:
2012 IEEE International Conference on Circuits and Systems (ICCAS), 190-193
Presented at:
2012 IEEE International Conference on Circuits and Systems (ICCAS), Kuala Lumpur, Malaysia, 3-4 October 2012
Year:
2012
Publisher:
New York, IEEE
ISBN:
978-1-4673-3119-7
Keywords:
Laboratories:




 Record created 2013-02-10, last modified 2018-09-13


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