Observation of amplitude and phase in ridge and photonic crystal waveguides operating at 1.55 μm by use of heterodyne scanning near-field optical microscopy

We apply heterodyne scanning near-field optical microscopy (SNOM) to observe with subwavelength resolution the amplitude and phase of optical fields propagating in several microfabricated waveguide devices operating around the 1.55 mu m wavelength. Good agreement between the SNOM measurements and predicted optical mode propagation characteristics in standard ridge waveguides demonstrates the validity of the method. In situ observation of the subwavelength-scale distribution and propagation of optical fields in straight and 90 degrees bend photonic crystal waveguides facilitates a more detailed understanding of the optical performance characteristics of these devices and illustrates the usefulness of the technique for investigating nanostructured photonic devices.


Publié dans:
Optics Letters, 30, 21, 2885
Année
2005
ISSN:
1539-4794
Mots-clefs:
Laboratoires:




 Notice créée le 2013-01-17, modifiée le 2018-12-03

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