III-nitride based microcavities (MCs) appear as one of the most promising candidates for the realization of room temperature (RT) polariton laser diodes. The present work focuses on the properties of low In content InGaN/GaN multiple quantum wells (MQWs) in terms of inhomogeneous broadening, exciton localization energy, and plastic strain relaxation. For a small number of such QWs, an inhomogeneous line broadening of 41 meV is reported, which is compatible with strong coupling regime requirements. By contrast when considering an InGaN/GaN MQW set, a high density of defects is reported, which is ascribed to plastic strain relaxation. From the evolution of the inhomogeneous line broadening as a function of the number of QWs probed by microphotoluminescence measurements, it is concluded that for the realization of polariton light-emitting devices the QW number should not go beyond 30 for MC structures grown on FS-GaN substrate relying on InGaN/GaN QWs with an indium content similar to 12-15% and thicknesses of 1.5-2 nm/3 nm for the wells and the barriers, respectively. (C) 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim