Enhanced Wafer Matching Heuristics for 3-D ICs


Published in:
Proceedings of the IEEE 17th European Test Symposium, 178
Presented at:
IEEE 17th European Test Symposium, Annecy, France, May 28- June 1, 2012
Year:
2012
Publisher:
New York, Ieee
ISBN:
978-1-4673-0697-3
Laboratories:




 Record created 2012-07-20, last modified 2018-03-17

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