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conference paper

Design improvement method using product usage data in a closed-loop PLM

Shin, Jong-Ho
•
Jun, Hong-Bae
•
Kiritsis, Dirnitris
Show more
2007
Product Lifecycle Management: Assessing The Industrial Relevance
4th International Conference on Product Lifecycle Management

Recently, companies have been able to gather product usage data during middle of life (MOL) owing to newly developed technologies such as RFID, various sensors, wireless telecommunication, and so on. Even though the technological infrastructure for gathering product usage data is established, the application of newly gathered product usage data is still in its infancy. If MOL data can be transformed into suitable information and knowledge for product design improvement with appropriate methods, it will be fruitful. To this end, in this study, we propose a design improvement method based on product usage data which are gathered by product embedded information device (PEID) in a closed-loop PLM.

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Type
conference paper
Web of Science ID

WOS:000254406500077

Author(s)
Shin, Jong-Ho
Jun, Hong-Bae
Kiritsis, Dirnitris
Xirouchakis, Paul  
Date Issued

2007

Publisher

Inderscience Enterprises Ltd, World Trade Center Building, 110 Avenue Louis Casai, Ch1215 15 Geneva Aeroport, Switzerland

Published in
Product Lifecycle Management: Assessing The Industrial Relevance
ISBN of the book

978-0-907776-32-1

Start page

743

End page

752

Subjects

product usage data

•

degradation

•

product improvement

•

Peid

•

Degradation

•

Performance

•

Prediction

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
LICP  
Event nameEvent placeEvent date
4th International Conference on Product Lifecycle Management

Stezzano, ITALY

Jul 11-13, 2007

Available on Infoscience
July 4, 2012
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/83547
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