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research article
Maximally-localized Wannier functions for disordered systems: Application to amorphous silicon
We use the maximally-localized Wannier function method to study bonding properties in amorphous silicon. This study represents, to our knowledge, the first application of the Wannier-function analysis to a disordered system. Our results show that, in the presence of disorder, this method is extremely helpful in providing an unambiguous picture of the bond distribution. In particular, defect configurations can be studied and characterized with a novel degree of accuracy that was not available before. (C) 1998 Elsevier Science Ltd. All rights reserved.
Type
research article
Authors
Publication date
1998
Published in
Volume
107
Issue
1
Start page
7
End page
11
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
June 29, 2012
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