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research article

Gate-controlled linear magnetoresistance in thin Bi2Se3 sheets

Gao, B. F.
•
Gehring, P.
•
Burghard, M.  
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2012
Applied Physics Letters

We explore the emergence of linear magnetoresistance in thin Bi2Se3 sheets upon tuning the carrier density using a back gate. With increasingly negative gate voltage, a pronounced magnetoresistance of similar to 100% is observed, while the associated B-field dependence changes from quadratic to linear. Concomitantly, the resistance-versus-temperature curves evolve from metallic to semiconductor-like, and increasingly strong weak anti-localization behavior is manifested. Analysis of the magnetoresistance data reveals two contributions, namely from the bulk conduction band and from a state inside the bulk gap. The latter is responsible for the linear magnetoresistance and likely represents the topologically protected surface state. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4719196]

  • Details
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Type
research article
DOI
10.1063/1.4719196
Web of Science ID

WOS:000304489900039

Author(s)
Gao, B. F.
Gehring, P.
Burghard, M.  
Kern, K.  
Date Issued

2012

Publisher

AIP American Institute of Physics

Published in
Applied Physics Letters
Volume

100

Issue

21

Article Number

212402

Subjects

Single Dirac Cone

•

Topological-Insulator

•

Surface

•

Bi2Te3

•

Sb2Te3

•

Limit

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSEN  
Available on Infoscience
June 22, 2012
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/82067
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