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book part or chapter
Reliability of Nanoelectronic VLSI
Iniewski, Krzysztof
Type
book part or chapter
Authors
Editors
Iniewski, Krzysztof
Publication date
2012
Publisher
Published in
Advanced Circuits for Emerging Technologies
ISBN of the book
978-0-470-90005-5
Publisher place
New Jersey
Start page
463
End page
481
EPFL units
Available on Infoscience
June 14, 2012
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