Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process


Published in:
Proc. IEEE European Solid-State Electron Device Conference (ESSDERC), 331-334
Presented at:
IEEE European Solid-State Electron Device Conference (ESSDERC), September, 2011
Year:
2011
Laboratories:




 Record created 2012-06-12, last modified 2018-03-17

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