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  4. Background-free imaging of plasmonic structures with cross-polarized apertureless scanning near-field optical microscopy
 
research article

Background-free imaging of plasmonic structures with cross-polarized apertureless scanning near-field optical microscopy

Esslinger, M.
•
Dorfmueller, J.
•
Khunsin, W.
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2012
Review of Scientific Instruments

We present advances in experimental techniques of apertureless scanning near-field optical microscopy (aSNOM). The rational alignment procedure we outline is based upon a phase singularity that occurs while scanning polarizers around the nominal cross-polarized configuration of s-polarized excitation and p-polarized detection. We discuss the theoretical origin of this topological feature of the setup, which is robust against small deviations, such as minor tip misalignment or shape variations. Setting the polarizers to this singular configuration point eliminates all background signal, allowing for reproducible plasmonic eigenmode mapping with optimal signal-to-noise ratio. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3693346]

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Type
research article
DOI
10.1063/1.3693346
Web of Science ID

WOS:000302227700028

Author(s)
Esslinger, M.
Dorfmueller, J.
Khunsin, W.
Vogelgesang, R.
Kern, K.  
Date Issued

2012

Published in
Review of Scientific Instruments
Volume

83

Issue

3

Article Number

033704

Subjects

Nanostructures

•

Resonances

•

Contrast

•

Probe

•

Nanocavities

•

Resolution

•

Amplitude

•

Model

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSEN  
Available on Infoscience
May 4, 2012
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/79985
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