Monte Carlo simulation of the field back-scattered from rough surfaces
2012
Abstract
A novel approach for the simulation of the field back-scattered from a rough surface is presented. It takes into account polarization and multiple scattering events on the surface, as well as diffraction effects. The validity and usefulness of this simulation is demonstrated in the case of surface topology measurement. (C) 2012 Optical Society of America
Details
Title
Monte Carlo simulation of the field back-scattered from rough surfaces
Author(s)
Delacretaz, Yves ; Seydoux, Olivier ; Chamot, Stephane ; Ettemeyer, Andreas ; Depeursinge, Christian
Published in
Journal Of The Optical Society Of America A-Optics Image Science And Vision
Volume
29
Pages
270-277
Date
2012
Keywords
Other identifier(s)
View record in Web of Science
Laboratories
LOA
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > LOA - Advanced Photonics Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2012-04-05