000174539 001__ 174539
000174539 005__ 20190812205557.0
000174539 0247_ $$2doi$$a10.1088/0953-2048/25/5/054007
000174539 02470 $$2ISI$$a000303663200008
000174539 037__ $$aCONF
000174539 245__ $$aMeasurement of Tc distribution in NbSn CICC
000174539 269__ $$a2012
000174539 260__ $$bSUST 2012$$c2012
000174539 336__ $$aConference Papers
000174539 520__ $$aKnowledge of the actual Nb3Sn filaments' thermal strain, epsilon(th), in a cable-in-conduit conductor (CICC) is essential to predict the CICC performance in operation starting from the strand scaling laws for the critical current density J(c)(B, T, epsilon). To obtain a measurement of epsilon(th) under relevant conditions, i.e. at low temperature and with the mechanical constraints of a long length section of CICC, the critical temperature as a function of the applied field, T-c(B), is measured by an inductive method for the CICC in situ and for the freestanding filaments used for the cable manufacture. To deduce the thermal strain in the CICC, the T-c(B) results are compared with the T-c(B, epsilon) curve. Starting from the susceptibility curves measured for both the CICC and the filaments, it is possible to compute the T-c distribution in the CICC using a deconvolution algorithm. The first results of T-c measured on two CICCs in the SULTAN test facility suggest a broad distribution of thermal strain, peaked at negative strain, which remains almost constant during the cyclic loading. From the knowledge of both the thermal strain distribution and the actual CICC performances, it will be possible to discriminate between reversible and irreversible degradation in Nb3Sn CICC.
000174539 6531_ $$asuperconductivity
000174539 700__ $$0242248$$g191446$$aCalzolaio, Ciro
000174539 700__ $$0240063$$g113537$$aBruzzone, Pierluigi
000174539 700__ $$0244063$$g206422$$aUglietti, Davide
000174539 7112_ $$dNovember 2011$$cOkinawa, Japan$$aMEM-11,
000174539 773__ $$j25$$tSuperconductor Science & Technology$$q054007
000174539 909C0 $$pCRPP
000174539 909C0 $$pSPC$$0252028$$xU10136$$xU12267$$xU12269$$xU12271$$xU10559$$xU12273$$xU10557$$xU12270$$xU10137$$xU10636$$xU12266$$xU10635$$xU10558$$xU12268$$xU12272
000174539 909CO $$pconf$$pSB$$ooai:infoscience.tind.io:174539
000174539 917Z8 $$x218840
000174539 917Z8 $$x105317
000174539 917Z8 $$x218840
000174539 917Z8 $$x218840
000174539 917Z8 $$x105317
000174539 937__ $$aEPFL-CONF-174539
000174539 973__ $$rREVIEWED$$sPUBLISHED$$aEPFL
000174539 980__ $$aCONF