Skew Variability in 3-D ICs with Multiple Clock Domains

The effect of process variations on the clock skew in three dimensional (3-D) circuits with multiple clock domains is investigated. In 3-D ICs, the combined effect of inter-die and intra-die process variations should be considered in the design of clock distribution networks. A statistical clock skew model incorporating spatially correlated intra-die process variations is employed to describe this effect. The clock skew is shown to change in different ways with the allocation of the clock domains within the 3-D circuit. Various schemes to assign the clock domains are investigated. Different scenarios of inter-die and intra-die process variations and an intra-die spatial correlation model are applied to these schemes. An approach where each physical plane corresponds to a single clock domain is shown to be inferior to other clocking schemes for specific variation scenarios. Tradeoffs between the number of clock domains within a physical plane and the number of planes a clock tree spans are discussed and related design guidelines are offered.


Published in:
Proceedings of Circuits and Systems (ISCAS), 2011 IEEE International Symposium on, 2221 - 2224
Presented at:
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on, Rio de Janeiro, Brazil, May 15-18, 2011
Year:
2011
Publisher:
Ieee Service Center, 445 Hoes Lane, Po Box 1331, Piscataway, Nj 08855-1331 Usa
ISBN:
978-1-4244-9473-6
Keywords:
Laboratories:




 Record created 2012-01-09, last modified 2018-04-28

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