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Bieletzki, M., Hynninen, T., Soini, T. M., Pivetta, M., Henry, C. R., Foster, A. S., Esch, F., Barth, C., & Heiz, U. (2010). Topography and work function measurements of thin MgO(001) films on Ag(001) by nc-AFM and KPFM. Physical Chemistry Chemical Physics, 12, 3203–3209. https://doi.org/10.1039/b923296f

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