research article
RTS Noise Characterization in Single-Photon Avalanche Diodes
Random telegraph signal (RTS) behavior is reported and characterized in the dark count rate of single-photon avalanche Diodes (SPADs). The RTS is observed in a SPAD fabricated in 0.8-mu m CMOS technology and in four proton-irradiated SPADs designed and fabricated in 0.35-mu m CMOS technology. The RTS characteristics are evaluated experimentally and verified theoretically with respect to bias and temperature.
Type
research article
Web of Science ID
WOS:000281833100020
Author(s)
Date Issued
2010
Published in
Volume
31
Start page
692
End page
694
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
December 16, 2011
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