RTS Noise Characterization in Single-Photon Avalanche Diodes
2010
Abstract
Random telegraph signal (RTS) behavior is reported and characterized in the dark count rate of single-photon avalanche Diodes (SPADs). The RTS is observed in a SPAD fabricated in 0.8-mu m CMOS technology and in four proton-irradiated SPADs designed and fabricated in 0.35-mu m CMOS technology. The RTS characteristics are evaluated experimentally and verified theoretically with respect to bias and temperature.
Details
Title
RTS Noise Characterization in Single-Photon Avalanche Diodes
Author(s)
Karami, Mohammad Azim ; Carrara, Lucio ; Niclass, Cristiano ; Fishburn, Matthew ; Charbon, Edoardo
Published in
Ieee Electron Device Letters
Volume
31
Pages
692-694
Date
2010
Publisher
Institute of Electrical and Electronics Engineers
ISSN
0741-3106
Keywords
Other identifier(s)
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Laboratories
AQUA
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > AQUA - Quantum Architecture Group
Scientific production and competences > EPFL Partners > Neuchâtel Campus > AQUA - Quantum Architecture Group
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Scientific production and competences > EPFL Partners > Neuchâtel Campus > AQUA - Quantum Architecture Group
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2011-12-16