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  4. High-Temperature Mechanical Spectroscopy of Nitrogen-Rich Ca-alpha-SiAlON Ceramics
 
research article

High-Temperature Mechanical Spectroscopy of Nitrogen-Rich Ca-alpha-SiAlON Ceramics

Mazaheri, Mehdi  
•
Mari, Daniele  
•
Schaller, Robert  
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2011
Journal of the American Ceramic Society

Nitrogen-rich Ca-alpha-SiAlON ceramics made with different starting powder compositions have been studied by high-temperature mechanical spectroscopy in parallel with compressive deformation in a spark plasma sintering equipment. The mechanical loss spectra measured upon heating show a relaxation peak at about 1150 K and a high-temperature exponential background at higher temperatures (> 1400 K), which are attributed to the alpha-relaxation in the glassy phase and to grain-boundary sliding, respectively. A theoretical interpretation of the results shows that the peak position is mainly a function of glass viscosity. The amplitude of the peak is not only affected by the glassy phase quantity but also depends on the restoring force due to grain elasticity. Therefore, despite a higher amount of glassy phase specimens containing elongated grains may show a lower peak. The amplitude of the internal friction peak corresponding to alpha-relaxation can be used to predict the compression creep of silicon-nitride-based ceramics.

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Type
research article
DOI
10.1111/j.1551-2916.2010.04251.x
Web of Science ID

WOS:000290530200042

Author(s)
Mazaheri, Mehdi  
Mari, Daniele  
Schaller, Robert  
Cai, Yanbing
Esmaeilzadeh, Saeid
Shen, Zhijian
Date Issued

2011

Published in
Journal of the American Ceramic Society
Volume

94

Start page

1536

End page

1545

Subjects

Pressed Silicon-Nitride

•

Grain-Boundary Phase

•

Internal-Friction

•

Rheological Behavior

•

Oxynitride Glasses

•

Si3N4 Ceramics

•

Creep-Behavior

•

Yttria

•

Microstructure

•

Relaxation

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPMC  
Available on Infoscience
December 16, 2011
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/74089
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