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  4. Development of Passivated Heterogeneous Metal Nanogaps Using E-Beam Overlay Techniques
 
conference paper

Development of Passivated Heterogeneous Metal Nanogaps Using E-Beam Overlay Techniques

Wu, Yexian  
•
Akiyama, Terunobu  
•
Gautsch, Sebastian  
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2011
Proceedings of Eurosensors XXV
Eurosensors XXV

We present a planar nanogap structure with heterogeneous metal electrodes separated by a distance of tens of nanometers. This asymmetric nanodevice is meant for metal/molecule/metal transport analysis. The heterogeneous aspect of the metal electrodes is meant to trigger the assembly orientation of selected molecules across the gap. With E-beam overlay technique and double-layer passivation, the structure has a well-defined and reproducible gap and shows good chemical durability and dielectric properties. (C) 2011 Published by Elsevier Ltd.s

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Type
conference paper
DOI
10.1016/j.proeng.2011.12.411
Web of Science ID

WOS:000300512400408

Author(s)
Wu, Yexian  
Akiyama, Terunobu  
Gautsch, Sebastian  
de Rooij, Nico  
Date Issued

2011

Publisher

Elsevier Science, Reg Sales Off, Customer Support Dept, 655 Ave Of The Americas, New York, Ny 10010 Usa

Published in
Proceedings of Eurosensors XXV
Series title/Series vol.

Procedia Engineering

Volume

25

Start page

1661

End page

1164

Subjects

Heterogeneous

•

Nanogap

•

E-beam lithography

•

molecule analysis

•

Nm Gaps

•

Fabrication

•

Electrodes

•

Junction

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
SAMLAB  
Event nameEvent placeEvent date
Eurosensors XXV

Athens, Greece

September 4-7, 2011

Available on Infoscience
November 10, 2011
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/72418
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