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conference paper
BACKSCATTERED ELECTRON IMAGES OF POLISHED CEMENT SECTIONS IN THE SCANNING ELECTRON MICROSCOPE
1984
Proceedings of the International Conference on Cement Microscopy
Using a pair of backscattered electron detectors in the scanning electron microscope, images can be produced in which the intensity is dependent solely on the molecular weight of the imaged area, and independent of small fluctuations in topography. The use of this technique with polished, unetched cement sections, reveals the unhydrated material, massive calcium hydroxide and other hydration products as clearly distinguishable features of the microstructure.
Type
conference paper
Scopus ID
2-s2.0-0021666317
Authors
Publication date
1984
Published in
Proceedings of the International Conference on Cement Microscopy
Start page
145
End page
155
Note
Cited By (since 1996): 9
Export Date: 1 June 2011
Source: Scopus
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
June 6, 2011
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