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research article
Optical Binding In Scanning Probe Microscopy
1994
When a light beam impinges on two interacting objects of subwavelength size, a spatially confined electromagnetic field arises in the immediate proximity of the particles. In scanning probe microscopy, short-range forces induced by this electromagnetic near-field change the magnitude of the probe tip-substrate interaction. In this letter we analyse the physical process responsible for these forces in the context of the localized field susceptibility method.
Type
research article
Web of Science ID
WOS:A1994NH19100007
Authors
Publication date
1994
Publisher
Published in
Volume
26
Start page
37
End page
42
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
April 11, 2011
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