Infoscience

Presentation / Talk

Multiwavelength High Resolution Interference Microscopy (HRIM) for the characterization of small size microlenes

Kim, Myun Sik; Scharf, Toralf; Herzig, Hans Peter
  • Presented at: Annual Conference of Association des Scientiques Coréens en France (ASCoF), Rennes, France, May 14, 2010
  • Publication date: 2010

    Reference

    • EPFL-TALK-161618

    Record created on 2010-12-13, modified on 2017-05-10

Fulltext

  • There is no available fulltext. Please contact the lab or the authors.

Related material

Contacts

EPFL authors