Multiwavelength High Resolution Interference Microscopy (HRIM) for the characterization of small size microlenes
2010
Details
Title
Multiwavelength High Resolution Interference Microscopy (HRIM) for the characterization of small size microlenes
Author(s)
Kim, Myun Sik ; Scharf, Toralf ; Herzig, Hans Peter
Conference
Annual Conference of Association des Scientiques Coréens en France (ASCoF), Rennes, France, May 14, 2010
Date
2010
Laboratories
OPT