In-situ electrical addressing of one-dimensional gold nanoparticle assemblies

Substrates with 1-dimensional nanosize grooves were prepared using extreme-ultraviolet interference lithography (EUV-IL), wherein gold nanoparticles were self-assembled to form 1-dimensional structures. To measure the electrical properties of gold nanoparticle chains we introduce a novel in-situ measuring method based on nanomanipulator system in a scanning electron microscope. This method comprises enormous versatility for the precisely electrical addressing of low-dimensional nanoscale structures and may even be applied to routinely addressing of structures in the sub-10 nm range.


Published in:
Journal Of Nanoscience And Nanotechnology, 8, 461-465
Year:
2008
ISSN:
1533-4880
Keywords:
Laboratories:




 Record created 2010-11-30, last modified 2018-03-17


Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)