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conference paper
On performance of series connected CMOS vertical hall devices
2008
2008 26Th International Conference On Microelectronics
Series connected (stacked) CMOS vertical Hall devices were analyzed on the basis of performance of a single five contacts device biased at different common mode voltages with respect to the substrate. The uneven influence of junction field effect on residual offset voltage, sensitivity and residual offset equivalent magnetic field was studied. It was shown that though junction field effect leads to some increase in offset voltage for devices with higher common mode, this effect can be minimized through suitable biasing.
Type
conference paper
Web of Science ID
WOS:000257432600069
Authors
Publication date
2008
Published in
2008 26Th International Conference On Microelectronics
Start page
337
End page
340
Subjects
Peer reviewed
REVIEWED
EPFL units
Event name | Event place | Event date |
Nis, SERBIA | May 11-14, 2008 | |
Available on Infoscience
November 30, 2010
Use this identifier to reference this record